Equipment Types |
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Wuhan YOHA Laser Technology Co., Ltd
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4th Floor, Section 2 Building, No. 777 Guanggu 3rd Road, Donghu New Technology Development Zone, Wuhan, Hubei
China
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Staff Information |
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Equipment Types |
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Application:
Mainly
used in automatic test and result record of solar
mono-crystalline
silicon, poly-crystalline silicon solar cell
module and
thin-film module.
Products Features:
1. Flash impulse
continuous adjustable range 0-60ms
2. Four-line
measurement; 14-bit 4-channel high-speed synchronous acquisition card, 8000
data collecting point;
3. 10 parameters
display;measured parameter display in tabulation and graphic way;
4. Irradiance
automatically compensating; temperature automatically
compensating;
5. Voice counts
off and prompts of flash time;counting prompts of flash
time
6. 24
consecutive hours of work, working life of imports Xenon lamp is 300,000 times
of flash
7. Patented
Design with high quality key components
8. Touch-screen
control
9. Independent explosion
proof control cabinet
10.Dell Computer
Model |
YHMT-AAA |
Feature |
Lamp Spectrum |
In line with IEC60904-9:2007(A Grade) |
1. Measurable parameters: I-V curve, short circuit
current, open circuit voltage, peak power, peak power point voltage, current,
fixed voltage current, filling factor, conversion efficiency, light intensity
and environmental temperature.
2. Automatic classification and display function. It can
be automatically classified according to the fixed voltage and current, and
the results of the classification can be displayed directly on the test
cabinet by digital display. Easy to use in production line. 3. Solar cells are connected by four wires to ensure
the current accuracy. 4. Measuring temperature and light intensity at the
same time to ensure the accuracy of automatic correction of solar cell
temperature and light intensity.
5. Self-tuning system with manual input compensation
parameters, automatic/manual temperature compensation, automatic light
intensity compensation, etc. |
Light Intensity |
1000W/m²(700W/m²-1200W/m²) |
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Light intensity non-uniformity |
≤±2%[A] |
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Instability degree of irradiation |
≤±2%[A] |
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Test results consistency |
≤±0.5%[A] |
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Test error of electrical properties |
≤1% A |
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Single flash time |
60ms |
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Effective Test Range |
2000mm×1500mm/20W~500W |
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Measuring Voltage |
0-200V(Resolution 1mV) |
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Measuring current |
200mA-20A(Resolution 1mA) |
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Environmental temperature |
15℃~30℃ |
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Test Parameters |
Isc, Voc,Pmax, Vm,Im,FF,EFF,Temp,Rs,Rsh |
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power |
220V/50Hz(60Hz) |
Applications:
The EL detection
system consists of 4 near-infrared
cameras(high quality 0.4mm/pixel), and the appearance AOI detection system consists of another 4 visible light cameras(high quality 0.09mm/pixel), which collect EL infrared images
and visible light images respectively.
The complete EL image and
visible image of the solar panel are obtained through multi-station image acquisition and multi-camera image splicing,. The system has high imaging
quality and small window to view details, which is conducive to the
determination of EL defects and appearance defects of solar panel.
The EL detection and AOI
appearance detection of PV panel can be independent detection system or combined into a set of
detection system.
Specification
1. Test Items: various types of solar panel;
2. Maximum field of vision: 2000mmx1000mm;
3. EL defect types: Hidden crack, broken grid, black center, black spot, dark
film, debris, etc;
4. Types of AOI appearance defects: foreign matter, damage, exposed white, color
difference, etc;
5. Detection efficiency: detection time of single panel
is about 20.0 seconds;
6. The communication between the network port and PLC
can be integrated with the production line;
7. Program controlled EL power supply, power parameters can be adjusted by the program;
8. The type formula is flexible and can be compatible
with various product models;
9. With database function, test results can be saved
and queried
10. With the function of small window to view details;
11. The software interface is friendly and easy to
operate;
12. EL detection system consists of four near-infrared industrial cameras, four
high-definition lenses, filters and detection software;
13. The appearance inspection system consists of four
visible light cameras, four high-definition lenses, light sources, filters and
inspection software.
Feature
1. Special light source and image acquisition system, stable and high
quality image;
2. Sony CCD chips
3. The image mosaic is accurate without obvious dislocation;
4. High detection efficiency, easy
to integrate with production line;
5. Intelligent image processing
algorithm, stable and reliable detection results;
6. Compatible with a variety of products and models, effectively reduce
enterprise costs;
A-grade Panel EL Image
A-Grade Panel AOI Appearance Image
Defect EL Images:
like Hidden
crack, broken grid, black center, black spot, dark film, debris etc:
Defect AOI Appearance image:
Foreign
matter, damage, exposed white, color difference, etc
Used to test the electrical performance
of Mono-Si or Poly-si
solar cell pieces and record the results in files.
Type
specification: YHCT-AAA
Machine
Feature:
A grade spectrum
A grade unevenness degree of irradiance
Four-line measure, 14-bit 4-channel high speed
synchronous acquisition card
10 parameters display and Measurement Parameter
display in Tabulation and
Graphic way
Pneumatic and buffering contact
Temperature automatically compensation
Voice counts off and prompts, Counting prompt of
flash
24hours Continuous work
Specifications :
Solar Cell Tester
1. Test Size: 200X200mm
2. Test rang: 0.1W-5W
Package Measurement: 94X80X210 CM
Cross Weight: 158KG
Technical
Parameter:
Lamp Spectrum: In
line with IEC60904-9 and JISC8933 ( A Grade)
Light Intensity: 100mW/cm2 (continuous
adjustable range 20-120W/cm2
Light intensity non-uniformity: ≤ ± 2% A
Instability degree of irradiation: ≤ ± 2% A
Test result consistency: ≤ ± 0.5% A
Test error of electrical properties: ≤ 2%
Single flash time: 10-30ms
Effective test range: 200X200mm(0.1-5W)
Measuring voltage: 0-0.8V(Resolution 1mV)
Measuring current: 0~0.8V (Resolution 1mV)
Test parameters: Isc, Voc, Pmax, Vm, Im, FF,
EFF, Temp, Rs, RSH
Power demand: 380V(220V)/50HZ(60HZ)/3KVA
Model: YHEL-A-2400
Applications:
Test
and inspect the micro-crack, breakage, broken fingers of the cells and
pseudo-soldering of the modules; also applicable to check or find the mismatch
of the cells or strings with different power rating.
Equipment
Features
-
Imported CCD chips ensured superior imaging and longer useful life - High
precision of multifunctional control card can be ensured the coordination work
of electric control system and image acquisition system
- The
solar panel can be automatically transferred, connected and image collected.
- High
reliability, high precision, realized seamless connection with the automatic
production
lines,
reduces labor costs, maximized productivity
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Imported top key components of the system control, motive power transmission,
pneumatic drive, sensing and measurement; ensures the equipment work in more
stable performance and longer useful life.
Technical
Specifications:
Product model |
YHEL-2400 |
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Resolution |
6016x4000 Megapixels |
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Shooting mode |
Single or Multiple camera |
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Sensitivity |
Can detect crack width less
than 0.2um |
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Effective test area |
1200*2000mm |
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Image acquisition time |
1~60s can be
adjusted |
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Machine size |
2300*2000*1100mm |
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Power |
Single-phrase 220V 10A, max
load voltage 60V, max load currency10A |
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Working environment temperature |
-10~40℃ |
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SNR |
>56dB |
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Humidity |
20 ~70% |
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Test
parameters |
Target, Gain, Time, Gamma, Contrast,
Data wide |
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Include |
Cabinet(Include infrared camera)+Computer + Software |
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Application:
Mainly used in automatic test and result
record of solar
mono-crystalline
silicon, poly-crystalline silicon solar cell
module
and thin-film module.
Products Features:
1.
Flash impulse continuous adjustable range
10-100ms
2.
Four-line measurement; 14-bit 4-channel high-speed synchronous
acquisition
card, 8000 data collecting point;
3. 10
parameters display;measured parameter display in tabulation and graphic
way;
4.
Irradiance automatically compensating; temperature automatically
compensating;
5.
Voice counts off and prompts of flash time;counting prompts of flash
time
6. 24
consecutive hours of work, working life of imports Xenon lamp is 300,000 times
of flash
Technical Data:
Model |
YHMT-AAA YHMT-AA |
Lamp Spectrum |
In line with IEC60904-9 and JISC8933(A Grade) |
Light Intensity |
100mW/cm2(continuous adjustable range20-120mW/cm2) |
Light intensity non-uniformity |
≤±2%[A] ±3% |
Instability degree of irradiation |
≤±2%[A] ±2% |
Test results consistency |
≤±0.5%[A] ±1% |
Test error of electrical properties |
≤2% |
Single flash time |
10ms-30ms 10ms |
Effective Test Range |
1200*2000nm /5W-300W |
Measuring Voltage |
0-100V(Resolution 1mV) |
Measuring current |
0-20A(Resolution 1mA) |
Environmental temperature |
15℃~30℃ |
Test Parameters |
Isc, Voc,Pmax, Vm,Im,FF,EFF,Temp,Rs,Rsh |
power |
220V/50Hz(60Hz) |
Equipment, machine configuration:
1. Test
Host(With electronic load):1 set
2.
Light source(With optical system):2 Pieces
3. PC:1
set
4.
High-speed data collection A/D plant:1 piece
5.
Dedicated measurement software:1 set
6. Test
bench:1 set
7.
Standard Battery(Compensation and correction for the irradiance uniformity
measurements):1 piece
8.
Size:2.64*1.48*1.2m (Host)+0.86*0.61*0.95m(Spare parts)
9. G.weight:400KGS+25KGS